Original language | English |
---|---|
Pages (from-to) | 53-63 |
Number of pages | 11 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5410 |
DOIs | |
State | Published - 2004 |
Externally published | Yes |
Event | Radar Sensor Technology VIII and Passive Millimeter-Wave Imaging Technology VII - Orlando, FL, United States Duration: Apr 14 2004 → Apr 15 2004 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Keywords
- Fourier Analysis
- Rayleigh's criterion
- Resolution