Carbon stain effects from SEM exposure

John Grantz, Robert K. Henderson, James Wood

Producción científica: Conference articlerevisión exhaustiva

Idioma originalEnglish
Páginas (desde-hasta)I/-
PublicaciónProceedings of SPIE - The International Society for Optical Engineering
Volumen3873
EstadoPublished - 1999
Evento19th Annual BACUS Symposium on Photomask Technology - Monterey, CA, USA
Duración: sept 15 1999sept 17 1999

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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